Beilstein J. Nanotechnol.2023,14, 1200–1207, doi:10.3762/bjnano.14.99
. However, this method yields an accurate estimate of the tip radius with a low root mean squared error of the curve fitting results.
Keywords: AFMtipcalibration; nonlinear regression curve fitting; Introduction
Atomic force microscopy (AFM) with a sharp tip is typically used to characterize
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Figure 1:
SEM images of (a) the Pt-coated tip, (b) the Cr/Au-coated tip, and (c) the uncoated silicon tip [9].